Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Development of a Stigmatic Ion Imaging Method of Secondary Ion Mass Spectrometry by Using a qCMOS Camera with Ultra-low Readout Noise (MZZ45-09)(abs.)

Authors=Shinri OKANO, Chikashi Yoshimoto, Shoichi Itoh

Journal/Book_names=Abstracts, Japan Geoscience Union Meeting (online)

volume=2024

pages=MZZ45-09

Publish_year=2024

Publisher=Japan Geoscience Union

Language_of_Text=JA

ID=300045043

@id=https://gbank.gsj.jp/ld/resource/geolis/300045043