Geological Literature
Development of a Stigmatic Ion Imaging Method of Secondary Ion Mass Spectrometry by Using a qCMOS Camera with Ultra-low Readout Noise (MZZ45-09)(abs.)
Shinri OKANO, Chikashi Yoshimoto, Shoichi Itoh
| item | description |
|---|---|
| Title | Development of a Stigmatic Ion Imaging Method of Secondary Ion Mass Spectrometry by Using a qCMOS Camera with Ultra-low Readout Noise (MZZ45-09)(abs.) |
| Authors | Shinri OKANO, Chikashi Yoshimoto, Shoichi Itoh |
| Data name | Abstracts, Japan Geoscience Union Meeting (online) |
| Volume | 2024 |
| Page | MZZ45-09 |
| Year | 2024 |
| Publisher | Japan Geoscience Union |
| Language | JA |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=300045043 |
| Link | |
| @id | https://gbank.gsj.jp/ld/resource/geolis/300045043 |