Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Fundamentals of Mass Spectrometry - Secondary Ion Mass Spectrometry (SIMS), Cluster SIMS, and Electrospray Droplet Impact SIMS -

Authors=HIRAOKA Kenzo

Journal/Book_names=Journal of the Mass Spectrometry Society of Japan

volume=58

number=5

pages=175-184

Publish_year=2010

Publish_Country=JPN

Publisher=Mass Spectrometry Society of Japan

Language_of_Text=JA

Language_of_Abs=EN

ISSN=13408097

ID=201022825

@id=https://gbank.gsj.jp/ld/resource/geolis/201022825