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Fundamentals of Mass Spectrometry - Secondary Ion Mass Spectrometry (SIMS), Cluster SIMS, and Electrospray Droplet Impact SIMS -
HIRAOKA Kenzo
itemdescription
TitleFundamentals of Mass Spectrometry - Secondary Ion Mass Spectrometry (SIMS), Cluster SIMS, and Electrospray Droplet Impact SIMS -
AuthorsHIRAOKA Kenzo
Data nameJournal of the Mass Spectrometry Society of Japan
Volume58
Num5
Page175-184
Year2010
PublisherMass Spectrometry Society of Japan
LanguageJA
Abstract languageEN
ISSN13408097
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=201022825
@idhttps://gbank.gsj.jp/ld/resource/geolis/201022825