Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

X-ray fluorescence (XRF; RIX-2100) analysis of major and trace elements for silicate rocks by low dilution glass bead method

Authors=SUDA Y., OKUDAIRA T., FURUYAMA K.

Journal/Book_names=Magma

number=92

pages=21-39

Publish_year=2010

Publish_Country=JPN

Publisher=Magmatism Research Group

Language_of_Text=JA

ID=201022288

@id=https://gbank.gsj.jp/ld/resource/geolis/201022288