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X-ray fluorescence (XRF; RIX-2100) analysis of major and trace elements for silicate rocks by low dilution glass bead method
SUDA Y., OKUDAIRA T., FURUYAMA K.
itemdescription
TitleX-ray fluorescence (XRF; RIX-2100) analysis of major and trace elements for silicate rocks by low dilution glass bead method
AuthorsSUDA Y., OKUDAIRA T., FURUYAMA K.
Data nameMagma
Num92
Page21-39
Year2010
PublisherMagmatism Research Group
LanguageJA
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=201022288
@idhttps://gbank.gsj.jp/ld/resource/geolis/201022288