TOF-SIMS Analysis of SiC Grains with High Lateral Resolution(abs.)

Authors=STEPHAN T., ROST D., JESSBERGER E.K., BUDELL R., GRESHAKE A., ZINNER E.K., AMARI S., LEWIS R.S.

Journal/Book_names=Lunar and Planetary Science 28, Abstracts of papers submitted to the Twenty-Eighth Lunar and Planetary Science Conference

number=3

pages=1371-1372

Publish_year=1997

Publish_Country=USA

Publisher=Lunar and Planetary Institute

Language_of_Text=EN

ID=200527838