Geological Literature
TOF-SIMS Analysis of SiC Grains with High Lateral Resolution(abs.)
STEPHAN T., ROST D., JESSBERGER E.K., BUDELL R., GRESHAKE A., ZINNER E.K., AMARI S., LEWIS R.S.
| item | description |
|---|---|
| Title | TOF-SIMS Analysis of SiC Grains with High Lateral Resolution(abs.) |
| Authors | STEPHAN T., ROST D., JESSBERGER E.K., BUDELL R., GRESHAKE A., ZINNER E.K., AMARI S., LEWIS R.S. |
| Data name | Lunar and Planetary Science 28, Abstracts of papers submitted to the Twenty-Eighth Lunar and Planetary Science Conference |
| Num | 3 |
| Page | 1371-1372 |
| Year | 1997 |
| Publisher | Lunar and Planetary Institute |
| Language | EN |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=200527838 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/200527838 |