Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

New method to obtain transmitted X-ray ad X-ray florescence profiles of soft sediments using scanning X-ray analytical microscope (P-261)(poster session)(abs.)

Authors=WADA Y., KATSUTA N., TAKANO M., KAWAI T.

Journal/Book_names=Abstracts, the 112nd Annual Meeting of the Geological Society of Japan

volume=112

pages=337-337

Publish_year=2005

Publish_Country=JPN

Publisher=Geological Society of Japan

Language_of_Text=JA

ISSN=13483935

DOI=10.14863/geosocabst.2005.0_337_2

ID=200512570

@id=https://gbank.gsj.jp/ld/resource/geolis/200512570