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New method to obtain transmitted X-ray ad X-ray florescence profiles of soft sediments using scanning X-ray analytical microscope (P-261)(poster session)(abs.)
WADA Y., KATSUTA N., TAKANO M., KAWAI T.
itemdescription
TitleNew method to obtain transmitted X-ray ad X-ray florescence profiles of soft sediments using scanning X-ray analytical microscope (P-261)(poster session)(abs.)
AuthorsWADA Y., KATSUTA N., TAKANO M., KAWAI T.
Data nameAbstracts, the 112nd Annual Meeting of the Geological Society of Japan
Volume112
Page337-337
Year2005
PublisherGeological Society of Japan
LanguageJA
ISSN13483935
DOI10.14863/geosocabst.2005.0_337_2
@idhttps://gbank.gsj.jp/ld/resource/geolis/200512570