Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

High-Resolution Rapid Elemental Analysis Using an XRF Microscanner

Authors=KOSHIKAWA Toshitada, KIDO Yoshiki, TADA Ryuji

Journal/Book_names=Journal of Sedimentary Research

volume=73

number=5

pages=824-829

Publish_year=2003

Publish_Country=USA

Publisher=Society for Sedimentary Geology

Language_of_Text=EN

Language_of_Abs=EN

ISSN=15271404

DOI=10.1306/020503730824

ID=200315454

@id=https://gbank.gsj.jp/ld/resource/geolis/200315454