Geological Literature
High-Resolution Rapid Elemental Analysis Using an XRF Microscanner
KOSHIKAWA Toshitada, KIDO Yoshiki, TADA Ryuji
| item | description |
|---|---|
| Title | High-Resolution Rapid Elemental Analysis Using an XRF Microscanner |
| Authors | KOSHIKAWA Toshitada, KIDO Yoshiki, TADA Ryuji |
| Data name | Journal of Sedimentary Research |
| Volume | 73 |
| Num | 5 |
| Page | 824-829 |
| Year | 2003 |
| Publisher | Society for Sedimentary Geology |
| Language | EN |
| Abstract language | EN |
| ISSN | 15271404 |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=200315454 |
| DOI | 10.1306/020503730824 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/200315454 |