Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Precise Isotopic Analysis of Silicon Crystal using SIMS (abs.)

Authors=MORISHITA Y., SATOH H., KITA N.T., TOGASHI S.

Journal/Book_names=Annual Meeting of the Geochemical Society of Japan

volume=47

pages=75-75

Publish_year=2000

Publish_Country=JPN

Publisher=Geochemical Society of Japan

Language_of_Text=JA

ID=200010890

@id=https://gbank.gsj.jp/ld/resource/geolis/200010890