Geological Literature
Precise Isotopic Analysis of Silicon Crystal using SIMS (abs.)
MORISHITA Y., SATOH H., KITA N.T., TOGASHI S.
| item | description |
|---|---|
| Title | Precise Isotopic Analysis of Silicon Crystal using SIMS (abs.) |
| Authors | MORISHITA Y., SATOH H., KITA N.T., TOGASHI S. |
| Data name | Annual Meeting of the Geochemical Society of Japan |
| Volume | 47 |
| Page | 75-75 |
| Year | 2000 |
| Publisher | Geochemical Society of Japan |
| Language | JA |
| @id | https://gbank.gsj.jp/ld/resource/geolis/200010890 |