Refractive index and degree of inhomogeneity of nanocrystalline TiO2 thin films: Effects of substrate and annealing temperature

Authors=MOSADDEQ-RAHMAN Md., YU Guolin, SOGA Tetsuo, JIMBO Takashi, EBISU Hiroshi, UMENO Masayoshi

Journal/Book_names=Journal of Applied Physics

volume=88

number=8

pages=4634-4641

Publish_year=2000

Publish_Country=USA

Publisher=American Institute of Physics

Language_of_Text=EN

Language_of_Abs=EN

ISSN=00218979

ID=200008870