Geological Literature
Refractive index and degree of inhomogeneity of nanocrystalline TiO2 thin films: Effects of substrate and annealing temperature
MOSADDEQ-RAHMAN Md., YU Guolin, SOGA Tetsuo, JIMBO Takashi, EBISU Hiroshi, UMENO Masayoshi
| item | description |
|---|---|
| Title | Refractive index and degree of inhomogeneity of nanocrystalline TiO2 thin films: Effects of substrate and annealing temperature |
| Authors | MOSADDEQ-RAHMAN Md., YU Guolin, SOGA Tetsuo, JIMBO Takashi, EBISU Hiroshi, UMENO Masayoshi |
| Data name | Journal of Applied Physics |
| Volume | 88 |
| Num | 8 |
| Page | 4634-4641 |
| Year | 2000 |
| Publisher | American Institute of Physics |
| Language | EN |
| Abstract language | EN |
| ISSN | 00218979 |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=200008870 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/200008870 |