Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

X-ray diffraction study of bond character of rutile-type SiO2, GeO2 and SnO2

Authors=YAMANAKA T., KURASHIMA R., MIMAKI J.

Journal/Book_names=Zeitschrift fur Kristallographie

volume=215

number=7

pages=424-428

Publish_year=2000

Publisher=Oldenbourg Verlag

Language_of_Text=EN

Language_of_Abs=EN

ISSN=00442968

DOI=10.1524/zkri.2000.215.7.424

ID=200007722

@id=https://gbank.gsj.jp/ld/resource/geolis/200007722