Geological Literature
X-ray diffraction study of bond character of rutile-type SiO2, GeO2 and SnO2
YAMANAKA T., KURASHIMA R., MIMAKI J.
| item | description |
|---|---|
| Title | X-ray diffraction study of bond character of rutile-type SiO2, GeO2 and SnO2 |
| Authors | YAMANAKA T., KURASHIMA R., MIMAKI J. |
| Data name | Zeitschrift fur Kristallographie |
| Volume | 215 |
| Num | 7 |
| Page | 424-428 |
| Year | 2000 |
| Publisher | Oldenbourg Verlag |
| Language | EN |
| Abstract language | EN |
| ISSN | 00442968 |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=200007722 |
| DOI | 10.1524/zkri.2000.215.7.424 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/200007722 |