Linked Data Service of GSJ
Geological Literature
X-ray diffraction study of bond character of rutile-type SiO2, GeO2 and SnO2
YAMANAKA T., KURASHIMA R., MIMAKI J.
itemdescription
TitleX-ray diffraction study of bond character of rutile-type SiO2, GeO2 and SnO2
AuthorsYAMANAKA T., KURASHIMA R., MIMAKI J.
Data nameZeitschrift fur Kristallographie
Volume215
Num7
Page424-428
Year2000
PublisherOldenbourg Verlag
LanguageEN
Abstract languageEN
ISSN00442968
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200007722
DOI10.1524/zkri.2000.215.7.424
@idhttps://gbank.gsj.jp/ld/resource/geolis/200007722