Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Quantitative X-ray microanalysis of sheet silicates by analytical TEM with ultra thin window type EDS

Authors=UEHARA Seiichiro

pages=32-33

Publish_year=1996

Publish_Country=JPN

Language_of_Text=JA

ID=199903904

@id=https://gbank.gsj.jp/ld/resource/geolis/199903904