Geological Literature
Quantitative X-ray microanalysis of sheet silicates by analytical TEM with ultra thin window type EDS
UEHARA Seiichiro
| item | description |
|---|---|
| Title | Quantitative X-ray microanalysis of sheet silicates by analytical TEM with ultra thin window type EDS |
| Authors | UEHARA Seiichiro |
| Data name | 超高分解能電子顕微鏡による鉱物の微細組織と超構造, 文部省科学研究費補助金(一般研究C)研究成果報告書(平成6年度)(課題番号05640538) |
| Page | 32-33 |
| Year | 1996 |
| Publisher | 上原 誠一郎(九州大学理学部) |
| Language | JA |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=199903904 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/199903904 |