Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Sample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating

Authors=TAKIZAWA Shigeru, OHNO Yoshiki

Journal/Book_names=Journal of the Mineralogical Society of Japan

volume=28

number=2

pages=65-69

Publish_year=1999

Publish_Country=JPN

Publisher=Mineralogical Society of Japan

Language_of_Text=JA

Language_of_Abs=EN

ISSN=04541146

DOI=10.2465/gkk1952.28.65

ID=199902828

@id=https://gbank.gsj.jp/ld/resource/geolis/199902828