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Sample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating
TAKIZAWA Shigeru, OHNO Yoshiki
itemdescription
TitleSample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating
AuthorsTAKIZAWA Shigeru, OHNO Yoshiki
Data nameJournal of the Mineralogical Society of Japan
Volume28
Num2
Page65-69
Year1999
PublisherMineralogical Society of Japan
LanguageJA
Abstract languageEN
ISSN04541146
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199902828
DOI10.2465/gkk1952.28.65
@idhttps://gbank.gsj.jp/ld/resource/geolis/199902828