Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Trace analysis of high-purity copper by total reflection X-ray fluorescence spectrometry

Authors=YAMAGUCHI Hitoshi, ITOH Sinji, IGARASHI Shukuro, NAITOH Kunishige, HASEGAWA Ryosuke

Journal/Book_names=Fresenius' Journal of Analytical Chemistry

volume=362

number=4

pages=395-398

Publish_year=1998

Publish_Country=DEU

Publisher=Springer-Verlag

Language_of_Text=EN

Language_of_Abs=EN

ISSN=09370633

ID=199811061

@id=https://gbank.gsj.jp/ld/resource/geolis/199811061