Geological Literature
Trace analysis of high-purity copper by total reflection X-ray fluorescence spectrometry
YAMAGUCHI Hitoshi, ITOH Sinji, IGARASHI Shukuro, NAITOH Kunishige, HASEGAWA Ryosuke
| item | description |
|---|---|
| Title | Trace analysis of high-purity copper by total reflection X-ray fluorescence spectrometry |
| Authors | YAMAGUCHI Hitoshi, ITOH Sinji, IGARASHI Shukuro, NAITOH Kunishige, HASEGAWA Ryosuke |
| Data name | Fresenius' Journal of Analytical Chemistry |
| Volume | 362 |
| Num | 4 |
| Page | 395-398 |
| Year | 1998 |
| Publisher | Springer-Verlag |
| Language | EN |
| Abstract language | EN |
| ISSN | 09370633 |
| GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=199811061 |
| @id | https://gbank.gsj.jp/ld/resource/geolis/199811061 |