Remaking a thin section into the polished and preferentially etched specimen for observing quartz under the episcopic differential interference microscope

Authors=HIGASHITANI Ken, TOYOHARA Fujio

Journal/Book_names=Kumamoto Journal of Science, Earth Sciences

volume=15

number=2

pages=9-17

Publish_year=1998

Publish_Country=JPN

Publisher=Faculty of Science, Kumamoto University

Language_of_Text=JA

Language_of_Abs=EN

ISSN=13433520

ID=199801725