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Remaking a thin section into the polished and preferentially etched specimen for observing quartz under the episcopic differential interference microscope
HIGASHITANI Ken, TOYOHARA Fujio
itemdescription
TitleRemaking a thin section into the polished and preferentially etched specimen for observing quartz under the episcopic differential interference microscope
AuthorsHIGASHITANI Ken, TOYOHARA Fujio
Data nameKumamoto Journal of Science, Earth Sciences
Volume15
Num2
Page9-17
Year1998
PublisherFaculty of Science, Kumamoto University
LanguageJA
Abstract languageEN
ISSN13433520
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199801725
@idhttps://gbank.gsj.jp/ld/resource/geolis/199801725