Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Measurement of light elements in silicon using by secondary ion mass spectrometry 2: Diffusion of carbon and boron implanted into silicon (abs.)

Authors=YUTANI M, HIYAGON H., SUGIURA N., HAMANO Y.

Journal/Book_names=Abstracts, Japan Earth and Planetary Science Joint Meeting

volume=1997

pages=796-796

Publish_year=1997

Publish_Country=JPN

Publisher=Seismological Society of Japan, Volcanological Society of Japan, Geodetic Society of Japan, Geochemical Society of Japan, Japanese Society for Planetary Sciences

Language_of_Text=JA

ID=199710378

@id=https://gbank.gsj.jp/ld/resource/geolis/199710378