Geological Literature Search (Geological Survey of Japan / AIST)

Measurement of light elements in silicon using by secondary ion mass spectrometry 2: Diffusion of carbon and boron implanted into silicon (abs.)

Authors=YUTANI M! HIYAGON H.! SUGIURA N.! HAMANO Y.

Journal/Book_names=Abstracts, Japan Earth and Planetary Science Joint Meeting

Publish_Country=Japan

volume=1997

pages=796-796

Publish_year=1997

Publisher=Seismological Society of Japan ! Volcanological Society of Japan ! Geodetic Society of Japan ! Geochemical Society of Japan ! Japanese Society for Planetary Sciences

Language_of_Text=JA

Data_Type=SE!CO

ID=199710378