Geological Literature
Measurement of light elements in silicon using by secondary ion mass spectrometry 2: Diffusion of carbon and boron implanted into silicon (abs.)
YUTANI M, HIYAGON H., SUGIURA N., HAMANO Y.
| item | description |
|---|---|
| Title | Measurement of light elements in silicon using by secondary ion mass spectrometry 2: Diffusion of carbon and boron implanted into silicon (abs.) |
| Authors | YUTANI M, HIYAGON H., SUGIURA N., HAMANO Y. |
| Data name | Abstracts, Japan Earth and Planetary Science Joint Meeting |
| Volume | 1997 |
| Page | 796-796 |
| Year | 1997 |
| Publisher | Seismological Society of Japan, Volcanological Society of Japan, Geodetic Society of Japan, Geochemical Society of Japan, Japanese Society for Planetary Sciences |
| Language | JA |
| @id | https://gbank.gsj.jp/ld/resource/geolis/199710378 |