Electromigration-induced void growth in bamboo structures

Authors=KAWANOUE T., KANEKO H., HASUNUMA M., MIYAUCHI M.

Journal/Book_names=Journal of Applied Physics

volume=74

number=7

pages=4423-4429

Publish_year=1993

Publish_Country=USA

Publisher=American Institute of Physics

Language_of_Text=EN

Language_of_Abs=EN

ISSN=00218979

ID=199302671