Geological Literature
Electromigration-induced void growth in bamboo structures
KAWANOUE T., KANEKO H., HASUNUMA M., MIYAUCHI M.
item | description |
---|---|
Title | Electromigration-induced void growth in bamboo structures |
Authors | KAWANOUE T., KANEKO H., HASUNUMA M., MIYAUCHI M. |
Data name | Journal of Applied Physics |
Volume | 74 |
Num | 7 |
Page | 4423-4429 |
Year | 1993 |
Publisher | American Institute of Physics |
Language | EN |
Abstract language | EN |
ISSN | 00218979 |
GEOLIS URL | https://darc.gsj.jp/archives/detail?cls=geolis&pkey=199302671 |
@id | https://gbank.gsj.jp/ld/resource/geolis/199302671 |