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Electromigration-induced void growth in bamboo structures
KAWANOUE T., KANEKO H., HASUNUMA M., MIYAUCHI M.
itemdescription
TitleElectromigration-induced void growth in bamboo structures
AuthorsKAWANOUE T., KANEKO H., HASUNUMA M., MIYAUCHI M.
Data nameJournal of Applied Physics
Volume74
Num7
Page4423-4429
Year1993
PublisherAmerican Institute of Physics
LanguageEN
Abstract languageEN
ISSN00218979
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=199302671
@idhttps://gbank.gsj.jp/ld/resource/geolis/199302671