Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

The Characterization of the (111) Facet Faces on the Seed Cone of (100) Silicon Single Crystals Grown by MCZ and CZ Methods by X-ray CTR Scattering

Authors=HARADA J., SHIMURA T., TAKATA M., YAKUSHIJI K., HOSHI K.

Journal/Book_names=Journal of Crystal Growth

volume=104

number=4

pages=773-779

Publish_year=1990

Publish_Country=NLD

Publisher=North-Holland

Language_of_Text=EN

Language_of_Abs=EN

ISSN=00220248

DOI=10.1016/0022-0248(90)90101-P

ID=199000757

@id=https://gbank.gsj.jp/ld/resource/geolis/199000757