Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Geological applications of particle-induced X-ray emission (PIXE): quantitative trace element microanalysis of single fluid inclusion in quartz

Authors=M. Kurosawa, S. Shimano, T. Kato, S. Sueno, S. Ishii, K. Shima

pages=22-25

Publish_year=2000

Language_of_Text=JA

Language_of_Abs=EN

ID=300045769

@id=https://gbank.gsj.jp/ld/resource/geolis/300045769