Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

Possibility of crystal structural refinement of thin-section samples by using wavelength scanning X-ray diffraction method (abs.)

Authors=Yusuke Matsuura, Kenji Hagiya, Tada-nori Goto

Journal/Book_names=GEOINFORUM-2021 Annual Meeting Abstracts (online)

volume=32

pages=19-20

Publish_year=2021

Publisher=Japan Society of Geoinformatics

Language_of_Text=JA

ID=300025048

@id=https://gbank.gsj.jp/ld/resource/geolis/300025048