Electrical resistivity structure beneath Gomura fault zone(Go-seihou fault, Gomura fault, Chuzenji Fault) (SSS12-16)(abs.)

Authors=MIMURA Akira, YAMAGUCHI Satoru, KURAMITSU Shin, KOZAKAI Ko, KIM Haeng-Yoong, MURAKAMI Hideki, KATOH Shigehiro

Journal/Book_names=Abstracts, Japan Geoscience Union Meeting, Program, JpGU-AGU Joint Meeting 2017 (DVD)

volume=2017

pages=SSS12-16

Publish_year=2017

Publish_Country=JPN

Publisher=Japan Geoscience Union

Language_of_Text=JA, EN

ID=201731909