Prestack deth migration for 2D crooked line surveys

Authors=SAITO Hideo, TAKANASHI Mamoru, NAKAJIMA Yoshinari, MINEGISHI Masato, ASAKAWA Eiichi

Journal/Book_names=Proceedings of the SEGJ International Symposium - Imaging Technology -

volume=6

pages=226-231

Publish_year=2003

Publish_Country=JPN

Publisher=Society of Exploration Geophysicists of Japan

Language_of_Text=EN

Language_of_Abs=EN

ISBN=4-938493-06-3

ID=201370083