Geological Literature Search (GEOLIS) (Geological Survey of Japan / AIST)

The method of preparation of thin section for X-ray micro-diffractometer

Authors=TOMAGAE Shuichi

Journal/Book_names=Report of the Geological Survey of Hokkaido

number=53

pages=95-98

Publish_year=1982

Publish_Country=JPN

Publisher=Geological Survey of Hokkaido

Language_of_Text=JA

ISSN=4410785

ID=198205007

@id=https://gbank.gsj.jp/ld/resource/geolis/198205007