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Three-dimensional Structural Analysis of Fault rock using Micro Focus X-ray CT scanner (poster session)(abs.)
NOHARA Shintaro, TANAKA Shiro, AIYAMA Kotaro
itemdescription
TitleThree-dimensional Structural Analysis of Fault rock using Micro Focus X-ray CT scanner (poster session)(abs.)
AuthorsNOHARA Shintaro, TANAKA Shiro, AIYAMA Kotaro
Data nameProceedings of the Annual meeting of the Japan Society of Engineering Geology
Volume2018
Page181-182
Year2018
PublisherJapan Society of Engineering Geology
LanguageJA
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=201860566
@idhttps://gbank.gsj.jp/ld/resource/geolis/201860566