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Modal analysis using X-ray analytical microscope and image processing and analyzing softwares (R2-P-3)(poster session)(abs.)
UEKI Tadamasa, NIWA Masakazu
itemdescription
TitleModal analysis using X-ray analytical microscope and image processing and analyzing softwares (R2-P-3)(poster session)(abs.)
AuthorsUEKI Tadamasa, NIWA Masakazu
Data nameAbstracts, the 123rd Annual Meeting of the Geological Society of Japan
Volume123
Page198-198
Year2016
PublisherGeological Society of Japan
LanguageJA
ISSN13483935
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=201671277
DOI10.14863/geosocabst.2016.0_385
@idhttps://gbank.gsj.jp/ld/resource/geolis/201671277