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Millimeter- to decimeter-scale compositional mapping using a scanning X-ray analytical microscope and its application to a reaction zone in high-grade metamorphic rock
UNO Masaoki, OKAMOTO Atsushi, TSUCHIYA Noriyoshi
itemdescription
TitleMillimeter- to decimeter-scale compositional mapping using a scanning X-ray analytical microscope and its application to a reaction zone in high-grade metamorphic rock
AuthorsUNO Masaoki, OKAMOTO Atsushi, TSUCHIYA Noriyoshi
Data nameJournal of Mineralogical and Petrological Sciences
Volume109
Num6
Page271-278
Year2014
PublisherJapan Association of Mineralogical Sciences
LanguageEN
Abstract languageEN
ISSN13456296
DOI10.2465/jmps.140613b
@idhttps://gbank.gsj.jp/ld/resource/geolis/201540106