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Precise structure analyses of the Earth and planetary materials by both diffraction and XAFS methods
YOSHIASA Akira
itemdescription
TitlePrecise structure analyses of the Earth and planetary materials by both diffraction and XAFS methods
AuthorsYOSHIASA Akira
Data nameJapanese Magazine of Mineralogical and Petrological Sciences
Volume42
Num3
Page111-122
Year2013
PublisherJapan Association of Mineralogical Sciences
LanguageJA
Abstract languageEN
ISSN1345630X
DOI10.2465/gkk.130305
@idhttps://gbank.gsj.jp/ld/resource/geolis/201322399