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Determination of trace amounts of halogens using an extenshon of Ar-Ar and I-Xe methods (O-3)(abs.)
SUMINO H., BAJO K., NAGAO K.
itemdescription
TitleDetermination of trace amounts of halogens using an extenshon of Ar-Ar and I-Xe methods (O-3)(abs.)
AuthorsSUMINO H., BAJO K., NAGAO K.
Data nameAbstracts, the 116th Annual Meeting of the Geological Society of Japan
Volume116
Page39-39
Year2009
PublisherGeological Society of Japan
LanguageJA
ISSN13483935
DOI10.14863/geosocabst.2009.0.76.0
@idhttps://gbank.gsj.jp/ld/resource/geolis/201040066