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Trace Analysis of Hexavalent Chromium in Chromium Compound by X-Ray Photoelectrom Spectroscopy
IIJIMA Yoshitoki, OKABE Kou, OHAMA Toshiyuki, TAKAHASHI Hideyuki
itemdescription
TitleTrace Analysis of Hexavalent Chromium in Chromium Compound by X-Ray Photoelectrom Spectroscopy
AuthorsIIJIMA Yoshitoki, OKABE Kou, OHAMA Toshiyuki, TAKAHASHI Hideyuki
Data nameAdvances in X-ray Chemical Analysis Japan, 39
Page137-142
Year2008
PublisherAgne Gijutsu Center, Tokyo
LanguageJA
Abstract languageJA, EN
ISSN09117806
ISBN978-4-901496-42-1
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=201020534
@idhttps://gbank.gsj.jp/ld/resource/geolis/201020534