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Ion Microprobe (ims 1270) Quantitative Analysis of Trace Elements of Volcanic Plagioclase using High Mass Resolution Method (V11D-12)(abs.)
TOGASHI Shigeko, KITA Noriko T., TOMIYA Akihiko, MORISHITA Yuichi
itemdescription
TitleIon Microprobe (ims 1270) Quantitative Analysis of Trace Elements of Volcanic Plagioclase using High Mass Resolution Method (V11D-12)(abs.)
AuthorsTOGASHI Shigeko, KITA Noriko T., TOMIYA Akihiko, MORISHITA Yuichi
Data nameEOS, Transactions, American Geophysical Union 1998 AGU Fall Meeting
Volume79
Num45
PageF951-F951
Year1998
PublisherAmerican Geophysical Union
LanguageEN
ISSN00963941
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200853147
@idhttps://gbank.gsj.jp/ld/resource/geolis/200853147