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Sensitive measurement of fluorescence XAFS using bent crystal analyzer ant its application to radiogenic osmium in molybdenite(abs.)
TAKAHASHI Yoshio
itemdescription
TitleSensitive measurement of fluorescence XAFS using bent crystal analyzer ant its application to radiogenic osmium in molybdenite(abs.)
AuthorsTAKAHASHI Yoshio
Data nameProgram & Abstracts, 19th General Meeting of the International Mineralogical Association - Expansion to Nano, Bio, and Planetary Worlds - IMA2006-Kobe, Japan, July 23-28, 2006
Page310-310
Year2006
Publisher19th General Meeting of the International Mineralogical Association
LanguageEN
@idhttps://gbank.gsj.jp/ld/resource/geolis/200740535