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Standardless XRF analysis fo LOI-rich rock samples by scatter fundamental parameter method (abs.)
MARTIN Al., INOUE Hisashi, YAMADA Yaujiro, KOHNO Hisayuki
itemdescription
TitleStandardless XRF analysis fo LOI-rich rock samples by scatter fundamental parameter method (abs.)
AuthorsMARTIN Al., INOUE Hisashi, YAMADA Yaujiro, KOHNO Hisayuki
Data nameGeochimica et Cosmochimica Acta, Special Supplement, Abstracts of the 15th Annual V.M. Goldschmidt Conference
Volume69
Num10S
PageA796-A796
Year2005
PublisherElsevier Ltd
LanguageEN
ISSN00167037
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200523681
DOI10.1016/j.gca.2005.03.037
@idhttps://gbank.gsj.jp/ld/resource/geolis/200523681