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X-Ray Photoelectron Microscopic Imaging of the Chemical Bonding State of Si in a Rock Sample (abs.)
SEYAMA H., WANG D., SOMA M.
itemdescription
TitleX-Ray Photoelectron Microscopic Imaging of the Chemical Bonding State of Si in a Rock Sample (abs.)
AuthorsSEYAMA H., WANG D., SOMA M.
Data name日本鉱物学会,日本岩石鉱物鉱床学会学術講演会講演要旨集
Volume2004
Page38-38
Year2004
Publisher日本鉱物学会, 日本岩石鉱物鉱床学会
LanguageJA
ISSN13486543
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200412461
@idhttps://gbank.gsj.jp/ld/resource/geolis/200412461