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Study on high-resolution technique using full-wave data acquired by refraction measurement layout
MATSUOKA Toshifumi, SANADA Yoshinori, O'NEILL Adam John, KAMEI Rie, HASEGAWA Nobusuke, KAGAWA Toshiyuki
itemdescription
TitleStudy on high-resolution technique using full-wave data acquired by refraction measurement layout
AuthorsMATSUOKA Toshifumi, SANADA Yoshinori, O'NEILL Adam John, KAMEI Rie, HASEGAWA Nobusuke, KAGAWA Toshiyuki
Data nameProceedings of the SEGJ Conference
Volume111
Page81-84
Year2004
PublisherThe Society of Exploration Geophysicists of Japan
LanguageJA
Abstract languageEN
@idhttps://gbank.gsj.jp/ld/resource/geolis/200411608