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Polytype distribution of circumstellar silicon carbide: Microstructural characterization by transmission electron microscopy
DAULTON T.L., BERNATOWICZ T.J., LEWIS R.S., MESSENGER S., STADERMANN F.J., AMARI S.
itemdescription
TitlePolytype distribution of circumstellar silicon carbide: Microstructural characterization by transmission electron microscopy
AuthorsDAULTON T.L., BERNATOWICZ T.J., LEWIS R.S., MESSENGER S., STADERMANN F.J., AMARI S.
Data nameGeochimica et Cosmochimica Acta
Volume67
Num24
Page4743-4767
Year2003
PublisherElsevier Ltd
LanguageEN
Abstract languageEN
ISSN00167037
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200410009
DOI10.1016/S0016-7037(03)00272-2
@idhttps://gbank.gsj.jp/ld/resource/geolis/200410009