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X線粉末回折で結晶構造解析ができるRietveld法--合成紅簾石の結晶構造解析を例にして--(演旨)
永嶌 真理子, 赤坂 正秀
itemdescription
TitleX線粉末回折で結晶構造解析ができるRietveld法--合成紅簾石の結晶構造解析を例にして--(演旨)
AuthorsJ永嶌 真理子, 赤坂 正秀
Data nameProgram and Abstracts, Annual Meeting of the Association for Geological Collaboration in Japan
Volume57
Page131-132
Year2003
PublisherAssociation for Geological Collaboration in Japan
LanguageJA
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200305805
@idhttps://gbank.gsj.jp/ld/resource/geolis/200305805