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Asymmetric peak line shape of infrared dielectric function spectra for thermally grown silicon dioxide films
ISHIKAWA Kenji, SUZUKI Kunihiro, OKAMURA Shigeru
itemdescription
TitleAsymmetric peak line shape of infrared dielectric function spectra for thermally grown silicon dioxide films
AuthorsISHIKAWA Kenji, SUZUKI Kunihiro, OKAMURA Shigeru
Data nameJournal of Applied Physics
Volume88
Num12
Page7150-7156
Year2000
PublisherAmerican Institute of Physics
LanguageEN
Abstract languageEN
ISSN00218979
GEOLIS URLhttps://darc.gsj.jp/archives/detail?cls=geolis&pkey=200012242
@idhttps://gbank.gsj.jp/ld/resource/geolis/200012242